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› ASTM D 5796-2003 用钻孔装置进行破坏法测试薄膜涂覆系统的干...
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发表于 2009-10-19 08:48:22
ASTM D 5796-2003 用钻孔装置进行破坏法测试薄膜涂覆系统的干...
D5796-03 Standard Test Method for Measurement of Dry Film Thickness of Thin Film Coil-Coated Systems by Destructive Means Using a Boring Device
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ASTM D 5796-2003 用钻孔装置进行破坏法测试薄膜涂覆系统的干...