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发表于 2009-11-5 08:59:54
ASTM E 1217-2005 用X射线光电子光谱仪和俄歇电子光谱仪测定...
E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers