论坛 › 美国标准 › ASTM F 1259M-1996 金属电迁移造成的喷镀开路或阻力增加失效...
兑水
发表于 2009-11-30 10:34:34
ASTM F 1259M-1996 金属电迁移造成的喷镀开路或阻力增加失效...
F1259M-96(2003) Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration